System for detecting rotational angle of objective pattern

Image analysis – Histogram processing – For setting a threshold

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

382 46, G06K 936

Patent

active

048767328

ABSTRACT:
A system and method for determining a rotational angle of an objective pattern which involves calculating the area A and linear moments M.sub.x and M.sub.y of the pattern from binary picture elements formed after optically sensing the pattern. The picture elements are stored in the memory in binary form. The center of gravity of the objective pattern is calculated on the basis of the area A and the linear moments M.sub.x and M.sub.y, and a circular or ring-like search region (a window) is formed about that center of gravity. Thereafter, significant picture information in the search region is extracted from the picture information stored in the memory (in either an inverted or non-inverted state). The rotational angle of the objective pattern is then determined either by using a moment of inertia method or a inter two-gravity centers method calculation. The selection between the moment of inertia method and the inter two-gravity centers method can be performed by means of pre-set switch state information.

REFERENCES:
patent: 4435837 (1984-03-01), Abernathy
patent: 4475122 (1984-10-01), Green
patent: 4499597 (1985-02-01), Alves
patent: 4658428 (1987-04-01), Bedros et al.
patent: 4672676 (1987-06-01), Linger
patent: 4680802 (1987-07-01), Nishida et al.
patent: 4748676 (1988-05-01), Miyagawa

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

System for detecting rotational angle of objective pattern does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with System for detecting rotational angle of objective pattern, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and System for detecting rotational angle of objective pattern will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1593490

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.