4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

Yue-Ying Jian

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Apparatus for shear testing bonds on silicon substrate

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate

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Fluxless bumping process

Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate

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Fluxless bumping process

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2208990

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