4. Radiant energy
  5. Inspection of solids or liquids by charged particles
  6. Analyte supports

Yu Ishibashi

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Electron beam focusing system for electron microscope

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens
Patent

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Specimen-driving apparatus for electron microscope which tilts a

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Patent

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Profile ID: LFUS-PAI-P-1709513

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