4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Young-Keun Choi

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Burn-in test circuit for semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Burn-in voltage detection circuit for semiconductor chip

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Reference voltage generating circuit having a power conserving s

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – With specific source of supply or bias voltage
Patent

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Profile ID: LFUS-PAI-P-312375

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