Burn-in voltage detection circuit for semiconductor chip

Details Burn-in voltage detection circuit for semiconductor chip Burn-in voltage detection circuit for semiconductor chip

1995-11-15

1997-08-12

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324760, G01R 3128

Patent

active

056569440

ABSTRACT:
An improved burn-in voltage detection circuit for a semiconductor chip capable of detecting a predetermined voltage level related to a burn-in operation using a specific element irrespective of manufacturing variation, which includes an external voltage detection circuit for detecting whether an external voltage level is higher than a prescribed internal reference voltage level, and in response producing a burn-in enable signal; and a burn-in conversion detection circuit including a hysteresis characteristic, activated by the burn-in enable signal and responsive to the externally applied voltage and the internal reference voltage, for producing a burn-in signal of a first state as the external voltage is increased in magnitude above the level of the prescribed internal reference voltage by a component of the hysteresis characteristic, and a burn-in signal of a second state as the external voltage is reduced in magnitude below the level of the prescribed internal reference voltage by a component of the hysteresis characteristic.

REFERENCES:
patent: 5068599 (1991-11-01), Niehaus
patent: 5349290 (1994-09-01), Yamada

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