4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Young June Nam

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Circuit and method for fully on-chip wafer level burn-in test

Static information storage and retrieval – Read/write circuit – Testing
Utility Patent

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Circuit for generating internal column strobe signal in...

Static information storage and retrieval – Addressing – Sync/clocking
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2085563

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