4. Error detection/correction and fault detection/recovery
  5. Data processing system error or fault handling
  6. Reliability and availability

Yotaro Mori

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High speed CAM cell

Static information storage and retrieval – Associative memories – Ferroelectric cell
Reexamination Certificate

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Layout structure for motor-driven power steering unit...

Motor vehicles – Steering gear – With electric power assist
Reexamination Certificate

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Processor based BIST for an embedded memory

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Patent

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Semiconductor device and semiconductor device testing method

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Sense-amplifying circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Specific signal discriminating without subsequent control – By amplitude
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1282564

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