4. Photography
  5. Camera shake sensing
  6. With accelerometer

Yoshinori Sango

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Atomic force microscope using cantilever attached to optical mic

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Piezoelectric vibration angular velocity meter and camera using

Photography – Camera shake sensing – With accelerometer
Patent

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Piezoelectric vibration angular velocity meter and camera using

Photography – Camera shake sensing – With accelerometer
Patent

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Piezoelectric vibration angular velocity meter and camera...

Photography – Camera shake sensing – With accelerometer
Reissue Patent

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Scanning probe microscope having a cantilever used therein

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Profile ID: LFUS-PAI-P-627106

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