4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis

Yoshihiro Isobe

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Current limiting apparatus

Electricity: electrical systems and devices – Safety and protection of systems and devices – With specific current responsive fault sensor
Reexamination Certificate

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Method of evaluating a degree of fatigue in a structural materia

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Profile ID: LFUS-PAI-P-522390

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