Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2006-08-22
2006-08-22
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
07096146
ABSTRACT:
A temperature adaptive circuit is provided which can perform an ordinary operation of an LSI circuit in a predetermined temperature range by raising the temperature of the LSI circuit up to the predetermined temperature range. The temperature adaptive circuit includes the LSI circuit that selectively performs, based on an instruction, an ordinary operation, which is an operation in a temperature range where the LSI circuit operates normally, or a temperature rise operation, which is an operation of raising the temperature of the LSI circuit to the predetermined temperature range, and a motion control section that outputs an instruction for either of said ordinary operation and said temperature rise operation to said LSI circuit.
REFERENCES:
patent: 5955907 (1999-09-01), Niijima
patent: 06-201780 (1994-07-01), None
Barlow John
Fujitsu Limited
Kundu Sujoy
Staas & Halsey , LLP
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