4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Yoshihiko Fujimori

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Mask inspecting apparatus

Image analysis – Histogram processing – For setting a threshold
Patent

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Pattern inspecting apparatus

Image analysis – Histogram processing – For setting a threshold
Patent

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Pattern inspection apparatus

Image analysis – Histogram processing – For setting a threshold
Patent

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Surface inspection method and surface inspection device

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Profile ID: LFUS-PAI-P-214290

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