4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Yohji Mashiko

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Apparatus for analyzing a failure in a semiconductor wafer and m

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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System for analyzing a failure in a semiconductor wafer by calcu

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Profile ID: LFUS-PAI-P-1988237

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