4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Yi-Chang Hsieh

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12C/SMBus ladders and ladder enabled ICs

Electrical computers and digital data processing systems: input/ – Intrasystem connection – Bus access regulation
Reexamination Certificate

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Apparatus for eliminating electrostatic destruction

Coating apparatus – Control means responsive to a randomly occurring sensed... – Responsive to attribute – absence or presence of work
Reexamination Certificate

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Apparatus for picking-up an integrated circuit component

Material or article handling – Elevator or hoist and loading or unloading means therefor – Grab
Reexamination Certificate

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Chip-packaging substrate and test method therefor

Electricity: electrical systems and devices – Housing or mounting assemblies with diverse electrical... – For electronic systems and devices
Reexamination Certificate

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Contactor system for a ball grid array device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Profile ID: LFUS-PAI-P-1828487

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