4. Excavating

Yervant D. Lepejian

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Automatic failure analysis system

Excavating
Patent

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Built in self repair for DRAMs using on-chip temperature sensing

Excavating
Patent

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Dynamic database management system and method

Data processing: database and file management or data structures – Database design – Data structure types
Reexamination Certificate

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Method and apparatus for determining fault sources for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method for using built in self test to characterize input-to-out

Boots – shoes – and leggings
Patent

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Profile ID: LFUS-PAI-P-190524

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