4. Computer-aided design and analysis of circuits and semiconductor
  5. Nanotechnology related integrated circuit design

Yasuteru Makita

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Inter-functional-block restriction high-speed extraction...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Test circuit for logical integrated circuit and method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Profile ID: LFUS-PAI-P-2571681

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