4. Electric lamp and discharge devices: systems
  5. Discharge device load with fluent material supply to the...
  6. Plasma generating

Yasushi Toma

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Cantilever for use with atomic force microscope and process for

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Cantilever for use with atomic force microscope and process for

Measuring and testing – Surface and cutting edge testing – Roughness
Patent

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Electrochemical machining method and apparatus

Chemistry: electrical and wave energy – Apparatus – Electrolytic
Reexamination Certificate

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Electrochemical machining method and apparatus

Electrolysis: processes – compositions used therein – and methods – Electrolytic erosion of a workpiece for shape or surface... – Gap maintenance or defined tool-workpiece gap
Reexamination Certificate

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Electrolytic machining method and apparatus

Electrolysis: processes – compositions used therein – and methods – Electrolytic erosion of a workpiece for shape or surface... – Defined electrolyte movement or pressure
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1021398

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