4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

Yasuo Matsumiya

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Defect source analysis method, defect source analysis...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Magnetic disk memory device

Dynamic magnetic information storage or retrieval – Record transport with head stationary during transducing – Disk record
Patent

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Process of growing conductive layer from gas phase

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Patent

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Profile ID: LFUS-PAI-P-392267

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