4. Optics: measuring and testing
  5. Of light reflection

Xiaoyang Li

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Hybrid optical proximity correction for alternating aperture...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Lithography process modeling of asymmetric patterns

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Photodiode-based bi-directional reflectance distribution...

Optics: measuring and testing – Of light reflection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2257412

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