4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Wuudiann Ke

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Apparatus and method for hybrid pin control of boundary scan app

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Block based design methodology

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Block based design methodology

Electrical computers and digital processing systems: support – Digital data processing system initialization or configuration – Loading initialization program
Reexamination Certificate

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Block based design methodology

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Block based design methodology

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Profile ID: LFUS-PAI-P-823567

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