4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

William H. Howland, Jr.

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Apparatus and method for detecting soft breakdown of a...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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In-situ wafer and probe desorption using closed loop heating

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method and apparatus for determining concentration of...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method and apparatus for determining the dielectric constant...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method and apparatus for removing and/or preventing surface...

Drying and gas or vapor contact with solids – Process – With nondrying treating of material
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Profile ID: LFUS-PAI-P-2744088

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