4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Wendy W. Koba, Esq.

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Built-in self-test circuit for read channel device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Polycide gate structure with intermediate barrier

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent

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Power saving arrangement for a flash A/D converter

Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Patent

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