Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2008-04-08
2008-04-08
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C714S725000
Reexamination Certificate
active
11127451
ABSTRACT:
This invention discloses a method of specifying pin states for a memory chip having one or more pins. In one embodiment of the invention, the pins are prioritized to obtain a pin order, wherein the pin state of a pin of a higher order dominates the pin state of a pin of a lower order. A number of possible combinations of the pin states are generated for the pins based on the pin order. The possible combinations are presented using a data presentation format. At least one pin of a higher order dominates at least one pin of a lower order when the at least one pin of a higher order is set in a predetermined pin state, such that the number of the possible combinations presented is reduced by neglecting combinations generated by the pins states of the dominated pins.
REFERENCES:
patent: 6694464 (2004-02-01), Quayle et al.
Chen Yu Jen
Cheng Wei-Chia
Wu Huan An
Wu Jeremy
Kirkpatrick & Lockhart Preston Gates & Ellis LLP
Raymond Edward
Taiwan Semiconductor Manufacturing Co. Ltd.
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