4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Mechanical measurement system

Ward & Olivo LLP

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CRAM transistors with high immunity to soft error

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Electro-optic vision systems

Computer graphics processing and selective visual display system – Computer graphics processing – Three-dimension
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ESD protection structure

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
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ESD protection structure

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Frequency adaptive temperature variable attenuator

Wave transmission lines and networks – Attenuators
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