4. Electronic digital logic circuitry
  5. Clocking or synchronizing of logic stages or gates

Wang-Chin Chen

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High speed ATPG testing circuit and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Parametric measuring circuit for minimizing oscillation effect

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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Switch controlling circuit, switch circuit utilizing the...

Electronic digital logic circuitry – Clocking or synchronizing of logic stages or gates
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Profile ID: LFUS-PAI-P-2179828

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