4. Image analysis
  5. Applications
  6. Manufacturing or product inspection

Walter Dean Mieher

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Azimuth angle measurement

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Focus masking structures, focus patterns and measurements...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate

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Focus masking structures, focus patterns and measurements...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate

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Overlay alignment measurement mark

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Overlay marks, methods of overlay mark design and methods of...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2410415

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