4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Tuan L. Phan

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Built-in self repair circuitry utilizing permanent record of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Redundancy analysis for embedded memories with built-in self tes

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Testing methodology for embedded memories using built-in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1703899

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