4. Radiant energy
  5. Inspection of solids or liquids by charged particles

Tsugiko Takase

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Atomic force microscope

Optical: systems and elements – Compound lens system – Microscope
Patent

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Measuring device in a scanning probe microscope

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Micro-displacement detector device, piezo-actuator provided with

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Probe for a scanning tunneling microscope

Photography and optical equipment – Optical article not elsewhere specified – Lens or objective
Patent

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Probe unit for an atomic probe microscope

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent

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Profile ID: LFUS-PAI-P-231455

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