4. Static information storage and retrieval
  5. Read/write circuit
  6. Signals

Tsafrir Israeli

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Characterization of self time circuit

Static information storage and retrieval – Read/write circuit – Signals
Patent

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Method and apparatus for direct access test of embedded memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-520430

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