4. Static information storage and retrieval
  5. Addressing
  6. Sync/clocking

Toshihiro Terazawa

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Scan test circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit

Static information storage and retrieval – Addressing – Sync/clocking
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2961929

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