4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Toshiaki Ichinose

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Inspection method for soldered joints using x-ray imaging and ap

X-ray or gamma ray systems or devices – Specific application – Absorption
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Method and apparatus for detecting pattern defects

Image analysis – Histogram processing – For setting a threshold
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Method for producing thin film multilayer substrate, and method

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement
Patent

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Pattern defects detection method and apparatus

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-1561875

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