4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. For fault location

Tomohiro Takamatsu

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Ferroelectric capacitor with electrode formed in separate...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Ferroelectric capacitor with electrode formed in separate...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Inspection method for semiconductor memory

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Process for producing high quality PZT films for...

Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate

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Semiconductor device and manufacturing method of a...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2263152

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