4. Etching a substrate: processes
  5. Gas phase etching of substrate
  6. With measuring, testing, or inspecting

Thomas J. Sonderman

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Control methodology using optical emission spectroscopy...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Determining transmission of error effects for improving...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Dynamic process state adjustment of a processing tool to...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Dynamic targeting for a process control system

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method and apparatus for adaptively scheduling tool maintenance

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thomas J. Sonderman does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Thomas J. Sonderman, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thomas J. Sonderman will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2353479

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure