4. Measuring and testing
  5. Specimen stress or strain, or testing by stress or strain...
  6. By loading of specimen

Thomas H. Koschmieder

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Lead solder indicator and method

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Multiple layer strain gauge

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Reexamination Certificate

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Semiconductor device having a ball grid array and method...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Chip mounted on chip
Reexamination Certificate

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Semiconductor package having angulated interconnect surfaces

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2208105

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