4. Radiation imagery chemistry: process, composition, or product th
  5. Including control feature responsive to a test or measurement

Thomas G. Sopchak

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Circuit and method for monitoring defects

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Defect diagnosis for semiconductor integrated circuits

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Designing scan chains with specific parameter sensitivities...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Diagnostic method and apparatus for non-destructively...

Electrical pulse counters – pulse dividers – or shift registers: c – Shift register – Particular transfer means
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Method and structure for defect monitoring of semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
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Profile ID: LFUS-PAI-P-2384422

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