Apparatus and method for testing semiconductor integrated...

Details Apparatus and method for testing semiconductor integrated... Apparatus and method for testing semiconductor integrated...

2005-05-31

2005-05-31

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S754090

Reexamination Certificate

active

06900627

ABSTRACT:
A test ancillary device with data memory and an analysis section is disposed in the vicinity of a test circuit board. The data memory is divided into two memory sections such that, when digital test data are stored in one memory section, the digital test data that have already been stored in the other memory section are loaded for analysis purpose.

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Data sheet '64 Mb SDRAM, pp. 1-4, Micron Technology, Inc.

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