4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Terry L. Alford

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Cladded silver and silver alloy metallization for improved...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Detection of electromigration in integrated circuits

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate

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Direct patterning of nanometer-scale silicide structures on...

Semiconductor device manufacturing: process – Forming schottky junction – Using refractory group metal
Reexamination Certificate

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Flexible electronics using ion implantation to adhere...

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates
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Profile ID: LFUS-PAI-P-2775457

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