4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Tatsushi Higashi

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Electric contact device for establishing an improved contact...

Electrical connectors – Coupling part having handle or means to move contact... – Expandable – prong receiving socket
Reexamination Certificate

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Semiconductor device with test terminal and IC socket

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Test method of chips in a semiconductor wafer employing a test a

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Profile ID: LFUS-PAI-P-1046751

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