4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Takehiko Kijima

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Semiconductor device with suppressed crystal defects in...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Semiconductor integrated circuit with memory redundancy circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3074941

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