4. Scanning-probe techniques or apparatus; applications of scanning
  5. Monitoring the movement or position of the probe responsive...
  6. By optical means

Takayuki Uchihashi

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Atomic force microscope

Scanning-probe techniques or apparatus; applications of scanning – Monitoring the movement or position of the probe responsive... – By optical means
Reexamination Certificate

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Scan type probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Scan type probe microscope and cantilever drive device

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2341677

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