4. Static information storage and retrieval
  5. Read/write circuit
  6. Differential sensing

Takao Yanagida

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Fuse cutting test circuit, fuse cutting test method, and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Semiconductor storage device

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3220702

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