4. Static information storage and retrieval
  5. Read/write circuit
  6. Differential sensing

Takanori Yoshimatsu

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Semiconductor device and test method of semiconductor device

Multiplex communications – Diagnostic testing
Reexamination Certificate

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Semiconductor memory device and method of testing the device

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2920131

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