Semiconductor device and test method of semiconductor device

Details Semiconductor device and test method of semiconductor device Semiconductor device and test method of semiconductor device

2006-03-23

2010-02-09

Duong, Frank (Department: 2416)

Multiplex communications

Diagnostic testing

C257S048000

Reexamination Certificate

active

07660257

ABSTRACT:
There is provided a semiconductor device comprising, a function unit portion including a circuit element, rank data presenting results of a rank-classification test on the circuit element, the rank-classification test being performed on the basis of a plurality of test criteria on wafer state, a non-volatile memory portion in which the rank data are stored, and a control portion reading out the rank data from the non-volatile memory portion, the control portion being used in a product test after packaging.

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patent: 6119049 (2000-09-01), Peddle
patent: 2004/0088074 (2004-05-01), Chen et al.
Dawn et al, Flash Memory Die Sort by a Sample Classification Method, IEEE, 6 pages, 2005.

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