4. Image analysis
  5. Histogram processing
  6. For setting a threshold

Takafumi Okabe

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Defect detection method and its apparatus

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Image alignment method, comparative inspection method, and...

Image analysis – Image transformation or preprocessing – Changing the image coordinates
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Image alignment method, comparative inspection method, and...

Image analysis – Image transformation or preprocessing – Changing the image coordinates
Reexamination Certificate

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Inspection method and its apparatus, inspection system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
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Inspection method and its apparatus, inspection system

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1751818

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