4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Tad J. Wilder

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Chip design and fabrication method optimized for profit

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Optimization
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LSSD-compatible edge-triggered shift register latch

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Minimizing impact of design changes for integrated circuit...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate

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Partial good integrated circuit and method of testing same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Partial good integrated circuit and method of testing same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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Profile ID: LFUS-PAI-P-3110195

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