4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Symetrix Corporation

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1T1R resistive memory array with chained structure

Static information storage and retrieval – Systems using particular element – Resistive
Reexamination Certificate

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Antifuse programmable element using ferroelectric material

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Patent

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Apparatus for forming a thin film with a mist forming means

Coating apparatus – With vacuum or fluid pressure chamber
Patent

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Apparatus for measuring current and other parameters of an elect

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Barium strontium titanate integrated circuit capacitors and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-181156

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