4. Computer-aided design and analysis of circuits and semiconductor
  5. Integrated circuit design processing
  6. Testing or evaluating

Sunil Suresh Hatti

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Light weight and high throughput test case generation...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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System and method for creating different start cache and bus...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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System and method for increasing error checking performance...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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System and method for re-shuffling test case instruction...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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System and method for testing a large memory area during...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2221746

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