4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

Sunae Kang

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Load board with matrix card for interfacing to test device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method and apparatus for selecting optimum levels for in-system

Static information storage and retrieval – Floating gate – Particular biasing
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Profile ID: LFUS-PAI-P-1320963

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