4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Steven Richard Schofield

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Method and apparatus for testing a storage interface

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Single molecule array on silicon substrate for quantum computer

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction
Reexamination Certificate

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Substituted donor atoms in silicon crystal for quantum computer

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor
Reexamination Certificate

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