4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Steven L. Haehn

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Backside failure analysis capable integrated circuit packaging

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Metallic housing or support
Reexamination Certificate

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Method and apparatus for detecting defects in integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Secure, stable on chip silicon identification

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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System and method for determining a subthreshold leakage...

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed
Reexamination Certificate

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System for yield enhancement in programmable logic

Electronic digital logic circuitry – Multifunctional or programmable – Having details of setting or programming of interconnections...
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Profile ID: LFUS-PAI-P-1812236

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