4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Stephan B. Ackerman

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Device probe socket forming part of a test head, interfacing...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Junction leakage monitor for MOSFETs with silicide contacts

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having junction gate
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Method for forming a high areal capacitance planar capacitor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2067025

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